Zagozdzon-Wosik, W: search on Z-Library

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1

[IEEE 10th IEEE International Conference on Advanced Thermal Processing of Semiconductors - RTP 2002 - Vancouver, BC, Canada (25-27 Sept. 2002)] 10th IEEE International Conference of Advanced Thermal Processing of Semiconductors - Conductive borides used for junction formation and integration with contacts in deep 0.1 μm MOSFETs

Zagozdzon-Wosik, W., Ranjit, M., Ravindranath, D.B., Z. Zhang,, Charlson, J., Rusakova, I., van der Heide, P., Larson, L., Bennett, J., Tichy, R., Beebe, M.

Year:

2002

Language:

english

File:

PDF, 514 KB

english, 2002

2

[RTP 9th International Conference on Advanced Thermal Processing of Semiconductors. RTP 2001 - Anchorage, AK, USA (25-29 Sept. 2001)] 9th International Conference on Advanced Thermal Processing of Semiconductors, RTP 2001 - Device and material issues related to integration of junctions with contacts in deep 0.1 μm MOSFETs

Zagozdzon-Wosik, W., Shao, L., Menon, M., Arroyo-Castelazo, E., Rusakova, I., Wang, X., van der Heide, P., Liu, J., Chu, W.K., Bennet, J.

Year:

2001

Language:

english

File:

PDF, 365 KB

english, 2001

3

[IEEE International Conference on Advanced Thermal Processing of Semiconductors - Charleston, NC, USA (23-26 Sept. 2003)] 11th IEEE International Conference on Advanced Thermal Processing of Semiconductors. RTP 2003 - RTP of titanium boride for applications in front end processing

Zagozdzon-Wosik, W., Ranjit, R., Rusakova, I., van der Heide, P., Zhang, Z., Bennett, J.

Year:

2003

Language:

english

File:

PDF, 507 KB

english, 2003

4

Doping of p-type shallow junctions using electron beam evaporation of boron layers for compatibility with complementary-metal-oxide-semiconductor technology

Zagozdzon-Wosik, W., Pan, D., Davis, M. F., Rusakova, I., Zhang, Z.-H., Rhodes, K.

Journal:

Applied Physics Letters

Year:

1995

Language:

english

File:

PDF, 536 KB

english, 1995

5

Semifluorinated Alkylphosphonic Acids Form High-Quality Self-Assembled Monolayers on Ag-Coated Yttrium Barium Copper Oxide Tapes and Enable Filamentization of the Tapes by Microcontact Printing

Park, Chul Soon, Lee, Han Ju, Lee, Dahye, Jamison, Andrew C., Galstyan, Eduard, Zagozdzon-Wosik, Wanda, Freyhardt, Herbert C., Jacobson, Allan J., Lee, T. Randall

Journal:

Year:

2016

Language:

english

File:

PDF, 3.63 MB

english, 2016

6

Heavy doping parameters estimated from transistor measurements

Wieslaw Kuzmicz, Wanda Zagozdzon-Wosik

Journal:

Solid-State Electronics

Year:

1988

Language:

english

File:

PDF, 800 KB

english, 1988

7

Formation of contacts to shallow junctions using titanium silicide with diffusion barriers

W Zagozdzon-Wosik, I Rusakova, S.R Gooty, D Marton, J Li, Z.H Zhang, C.-H Lin, R.J Bleiler, D.X Zhang

Journal:

Materials Science in Semiconductor Processing

Year:

1998

Language:

english

File:

PDF, 292 KB

english, 1998

8

Emitter efficiency of Si bipolar transistors - structural and electrical investigations

W. Zagozdzon-Wosik, E. Mizera, W. Kużmicz

Journal:

physica status solidi (a)

Year:

1984

Language:

english

File:

PDF, 190 KB

english, 1984

9

Microstructure and electrical properties of diborides modified by rapid thermal annealing

W. ZAGOZDZON-WOSIK, I. RUSAKOVA, C. DARNE, Z.-H. ZHANG, P. VAN DER HEIDE, P. MAJHI

Journal:

Journal of Microscopy

Year:

2006

Language:

english

File:

PDF, 142 KB

english, 2006

10

Use of the radiofrequency-intermodulation distortion technique to investigate intrinsic nonlinearity at the electrode-electrolyte interface

Pande, Rohit, Xie, Leiming, Zagozdzon-Wosik, Wanda, Nesteruk, Krzysztof, Wosik, Jarek

Journal:

Applied Physics Letters

Year:

2012

Language:

english

File:

PDF, 1.09 MB

english, 2012

11

Reduction of electrode polarization capacitance in low-frequency impedance spectroscopy by using mesh electrodes

Divya Padmaraj, John H. Miller Jr., Jarek Wosik, Wanda Zagozdzon-Wosik

Journal:

Biosensors and Bioelectronics

Year:

2011

Language:

english

File:

PDF, 549 KB

english, 2011

12

Fabrication of submicron junctions-proximity rapid thermal diffusion of phosphorus, boron, and arsenic

Zagozdzon-Wosik, W., Grabiec, P.B., Lux, G.

Journal:

IEEE Transactions on Electron Devices

Year:

1994

Language:

english

File:

PDF, 1.07 MB

english, 1994

13

Silicon doping from phosphorus spin-on dopant sources in proximity rapid thermal diffusion

Zagozdzon-Wosik, W., Grabiec, P. B., Lux, G.

Journal:

Journal of Applied Physics

Year:

1994

Language:

english

File:

PDF, 1.31 MB

english, 1994

14

Doping of trench capacitors by rapid thermal diffusion

Zagozdzon-Wosik, W., Wolfe, J.C., Teng, C.W.

Journal:

IEEE Electron Device Letters

Year:

1991

Language:

english

File:

PDF, 264 KB

english, 1991

15

Parallel and orthogonal E -field alignment of single-walled carbon nanotubes by ac dielectrophoresis

Padmaraj, D, Zagozdzon-Wosik, W, Xie, L-M, Hadjiev, V G, Cherukuri, P, Wosik, J

Journal:

Year:

2009

Language:

english

File:

PDF, 1.45 MB

english, 2009

16

Microwave properties of single-walled carbon nanotubes films below percolation threshold

C. Darne, L. Xie, W. Zagozdzon-wosik, H. K. Schmidt, J. Wosik

Year:

2009

Language:

english

File:

PDF, 599 KB

english, 2009

17

Kinetics of phosphorus proximity rapid thermal diffusion using spin-on dopant source for shallow junctions fabrication

Grabiec, P. B., Zagozdzon-Wosik, W., Lux, G.

Journal:

Journal of Applied Physics

Year:

1995

Language:

english

File:

PDF, 1.20 MB

english, 1995

18

Nanogap Capacitors Used for Impedance Characterization of Living Cells

Padmaraj, Divya, Zagozdzon-Wosik, Wanda, Miller, John H., Charlson, Joe, Trombetta, Len

Journal:

MRS Proceedings

Year:

2006

Language:

english

File:

PDF, 2.10 MB

english, 2006

19

Defect Generation and Gettering during Rapid Thermal Annealing

Zagozdzon-Wosik, W.

Journal:

Journal of The Electrochemical Society

Year:

1988

Language:

english

File:

PDF, 2.09 MB

english, 1988

20

Resonant and Broadband Microwave Permittivity Measurements of Single-walled Carbon Nanotubes

Darne, Chinmay D., Xie, Lei-Ming, Padmaraj, Divya, Cherukuri, Paul, Zagozdzon-Wosik, Wanda, Wosik, Jarek

Journal:

MRS Proceedings

Year:

2007

Language:

english

File:

PDF, 1.04 MB

english, 2007

21

Formation of Shallow Junctions during Rapid Thermal Processing from Electron-Beam Deposited Boron Sources

Zagozdzon-Wosik, W.

Journal:

Journal of The Electrochemical Society

Year:

1996

Language:

english

File:

PDF, 3.95 MB

english, 1996

22

Biosensor for Dielectric Spectroscopy of Mitochondria and for Monitoring Ion Activities

Padmaraj, Divya, Pande, Rohit, Zagozdzon-Wosik, Wanda, Xie, Lei-Ming, Pijanowska, Dorota G, Miller, John H, Grabiec, Piotr B, Jaroszewicz, Bohdan, Widger, William, Wosik, Jarek

Journal:

MRS Proceedings

Year:

2009

Language:

english

File:

PDF, 159 KB

english, 2009

23

Investigation of Proximity Rtd for Submicron Junctions in Vlsi Si Devices

Zagozdzon-Wosik, W., Grabiec, P., Romero-Borja, F., Wood, L. T., Lux, G.

Journal:

MRS Proceedings

Year:

1993

Language:

english

File:

PDF, 320 KB

english, 1993

24

Boron Doping using Proximity Rapid Thermal Diffusion from Spin-on-Dopants

Rastogi, M., Zagozdzon-Wosik, W., Romero-Borja, F., Heddleson, J. M., Beavers, R., Grabiec, P., Wood, L. T.

Journal:

MRS Proceedings

Year:

1994

Language:

english

File:

PDF, 304 KB

english, 1994

25

Stress Effects in 2d Arsenic Diffusion in Silicon

Rao, V., Zagozdzon-Wosik, W.

Journal:

MRS Proceedings

Year:

1995

Language:

english

File:

PDF, 925 KB

english, 1995

26

Surface Effects in Silicon Doping with Boron During Proximity Rapid Thermal Diffusion

Mone, S., Zagozdzon-Wosik, W., Rastogi, M.

Journal:

MRS Proceedings

Year:

1995

Language:

english

File:

PDF, 351 KB

english, 1995

27

Novel silicon Titanium Diboride Micropatterned Substrates for Cellular Patterning

Friguglietti, Jefferson, Das, Susmi, Le, Phi, Fraga, Daniel, Quintela, Marcos, Gazze, Salvatore, McPhail, Darius, Gu, Jianhua, Sabek, Omaima, Gaber, A. Osama, Francis, Lewis W., Zagozdzon-Wosik, Wanda

Journal:

Year:

2020

File:

PDF, 4.79 MB

2020

28

Time of Flight Mass Spectroscopy of Recoiled Ions Studies of Gallium Nitride Thin Film Deposition by Various Molecular Beam Epitaxial Methods

Kim, E., Berichev, I., Bensaoula, A., Schultz, A., Waters, K., Zagozdzon-Wosik, W.

Journal:

MRS Internet Journal of Nitride Semiconductor Research

Year:

1998

File:

PDF, 159 KB

1998